David E. Aspnes
Manuel Cardona and Science: A Lasting Legacy
North Carolina State University, USA

Rasheed M. A. Azzam
Polarization, Thin-Film Optics, Ellipsometry, and Polarimetry: Retrospective
University of New Orleans, USA

Eva Bittrich
Spectroscopic VIS Ellipsometry on Functional Organic and Polymer Thin Films
Leibniz-Institut für Polymerforschung Dresden e.V., Germany

Alain C. Diebold
The Application of Mueller Matrix Spectroscopic Ellipsometry based ellipsometry to determination of the feature shape and dimensions of integrated circuit structures
SUNY Polytechnic Institute, USA

Hiroyuki Fujiwara
Ellipsometry and DFT Analyses of Solar Cell Materials
Gifu University, Japan

Karsten Hinrichs
Spectroscopic Ellipsometry and Nanopolarimetry of Organic Thin Films Using Brilliant Light Sources in the Mid Infrared Spectral Range
Leibniz-Institut für Analytische Wissenschaften-ISAS, Germany

Tino Hofmann
Ellipsometry at THz Frequencies: New Approaches for Metrology and metamaterial-based sensing
University of North Carolina at Charlotte, USA

Josef Humlíček
Understanding optical response: lessons learned from Manuel Cardona
Central European Institute of Technology, Masaryk University, Czechia

Gerald E. Jellison and Oriol Arteaga
Ellipsometric Data Analysis: I. Basic Concepts, II. Anisotropic and Complex Materials
Oak Ridge National Laboratory, USA. Universitat de Barcelona, Spain

Gang Jin
Biosensor based on Imaging Ellipsometry and its Applications in Biomedical and Environmental fields
Institute of Mechanics, Chinese Academy of Sciences, China

Maria Losurdo
Potential and perspective of ellipsometry in materials science
CNR-NANOTEC, Institute of Nanotechnology, Italy

Razvigor Ossikovski
Phenomenological Modelling in Mueller Matrix Polarimetry
École Polytechnique, France

Peter Petrik
In situ bioellipsometry
MFA Institute of Technical Physics and Materials Science, MTA Hungarian Academy of Sciences, Hungary

Luis Viña
The Persuasive and Inestimable Insistence of Manuel Cardona: How Spectroscopic Ellipsometry Was Born in Max-Planck Stuttgart
Universidad Autónoma de Madrid, Spain

Xiuguo Chen
Tomographic Mueller-matrix scatterometry for nanostructure metrology
Huazhong University of Science and Technology, China

Vanya Darakchieva
Stealth technology-based Terahertz frequency-domain ellipsometry for in-situ and ex-situ applications
Terahertz Materials Analysis Center THeMAC, Linköping University, Sweden

Zhigao Hu and Junhao Chu
Recent Progress on Ellipsometric Techniques for Probing Phase Transitions in Ferroelectric and Related Functional Materials
Technical Center for Multifunctional Magneto-Optical Spectroscopy, East China Normal University, China

Daesuk Kim
Dynamic spectroellipsometry based on a one-piece polarizing interferometric device
Division Mechanical System Engineering, Chonbuk National University, Republic of Korea

Sean Knight
Optical Hall effect enhancement techniques in two- and three- dimensional materials
Dept. of Electrical and Computer Engineering, University of Nebraska-Lincoln, USA

Alexey Kuzmenko
Infrared magneto-optical polarimetry on graphene and related materials
University of Geneva, Dept Quantum Matter Phys, Switzerland

Premysl Marsik
Granular Superconductivity in Cuprate/Manganite Multilayer Observed by THz Ellipsometry
University of Fribourg, Department of Physics, Superconductivity & Magnetism, Switzerland

Arturo Mendoza Galván
Advanced Modelling of Mueller Matrices for Circular Bragg Reflectors
Cinvestav-Querétaro, Mexico

Alyssa Mock
Generalized ellipsometry on low-symmetry materials
THz Materials Analysis Center and Center for III-Nitride Technology, Linköping University, Sweden

Tatiana Novikova
Histology of tissue with polarized light: differential Mueller matrix formalism
LPICM, CNRS, École Polytechnique, France

Wojciech Ogieglo
Ultra-Thin Composite Carbon Molecular Sieve Membranes from a Polymer of Intrinsic Microporosity Precursor
AMPMC, King Abdullah University of Science and Technology, Saudi Arabia

Steffen Richter
Femtosecond Transient Spectroscopic Ellipsometry on Semiconductors
ELI Beamlines, Fyzikální ústav AV ČR, v.v.i., Czechia