Plenary and Invited Speakers

  • PLENARY SPEAKERS

    David E. Aspnes
    Manuel Cardona and Science: A Lasting Legacy
    North Carolina State University, USA

    Rasheed M. A. Azzam
    Polarization, Thin-Film Optics, Ellipsometry, and Polarimetry: Retrospective
    University of New Orleans, USA

    Eva Bittrich
    Spectroscopic VIS Ellipsometry on Functional Organic and Polymer Thin Films
    Leibniz-Institut für Polymerforschung Dresden e.V., Germany

    Alain C. Diebold
    The Application of Mueller Matrix Spectroscopic Ellipsometry based ellipsometry to determination of the feature shape and dimensions of integrated circuit structures
    SUNY Polytechnic Institute, USA

    Hiroyuki Fujiwara
    Ellipsometry and DFT Analyses of Solar Cell Materials
    Gifu University, Japan

    Karsten Hinrichs
    Spectroscopic Ellipsometry and Nanopolarimetry of Organic Thin Films Using Brilliant Light Sources in the Mid Infrared Spectral Range
    Leibniz-Institut für Analytische Wissenschaften-ISAS, Germany

    Tino Hofmann
    Ellipsometry at THz Frequencies: New Approaches for Metrology and metamaterial-based sensing
    University of North Carolina at Charlotte, USA

    Josef Humlíček
    Understanding optical response: lessons learned from Manuel Cardona
    Central European Institute of Technology, Masaryk University, Czechia

    Gerald E. Jellison and Oriol Arteaga
    Ellipsometric Data Analysis: I. Basic Concepts, II. Anisotropic and Complex Materials
    Oak Ridge National Laboratory, USA. Universitat de Barcelona, Spain

    Gang Jin
    Biosensor based on Imaging Ellipsometry and its Applications in Biomedical and Environmental fields
    Institute of Mechanics, Chinese Academy of Sciences, China

    Maria Losurdo
    Potential and perspective of ellipsometry in materials science
    CNR-NANOTEC, Institute of Nanotechnology, Italy

    Razvigor Ossikovski
    Phenomenological Modelling in Mueller Matrix Polarimetry
    École Polytechnique, France

    Peter Petrik
    In situ bioellipsometry
    MFA Institute of Technical Physics and Materials Science, MTA Hungarian Academy of Sciences, Hungary

    Luis Viña
    The Persuasive and Inestimable Insistence of Manuel Cardona: How Spectroscopic Ellipsometry Was Born in Max-Planck Stuttgart
    Universidad Autónoma de Madrid, Spain

  • INVITED SPEAKERS

    Xiuguo Chen
    Tomographic Mueller-matrix scatterometry for nanostructure metrology
    Huazhong University of Science and Technology, China

    Vanya Darakchieva
    Stealth technology-based Terahertz frequency-domain ellipsometry for in-situ and ex-situ applications
    Terahertz Materials Analysis Center THeMAC, Linköping University, Sweden

    Zhigao Hu and Junhao Chu
    Recent Progress on Ellipsometric Techniques for Probing Phase Transitions in Ferroelectric and Related Functional Materials
    Technical Center for Multifunctional Magneto-Optical Spectroscopy, East China Normal University, China

    Daesuk Kim
    Dynamic spectroellipsometry based on a one-piece polarizing interferometric device
    Division Mechanical System Engineering, Chonbuk National University, Republic of Korea

    Sean Knight
    Optical Hall effect enhancement techniques in two- and three- dimensional materials
    Dept. of Electrical and Computer Engineering, University of Nebraska-Lincoln, USA

    Alexey Kuzmenko
    Infrared magneto-optical polarimetry on graphene and related materials
    University of Geneva, Dept Quantum Matter Phys, Switzerland

    Premysl Marsik
    Granular Superconductivity in Cuprate/Manganite Multilayer Observed by THz Ellipsometry
    University of Fribourg, Department of Physics, Superconductivity & Magnetism, Switzerland

    Arturo Mendoza Galván
    Advanced Modelling of Mueller Matrices for Circular Bragg Reflectors
    Cinvestav-Querétaro, Mexico

    Alyssa Mock
    Generalized ellipsometry on low-symmetry materials
    THz Materials Analysis Center and Center for III-Nitride Technology, Linköping University, Sweden

    Tatiana Novikova
    Histology of tissue with polarized light: differential Mueller matrix formalism
    LPICM, CNRS, École Polytechnique, France

    Wojciech Ogieglo
    Ultra-Thin Composite Carbon Molecular Sieve Membranes from a Polymer of Intrinsic Microporosity Precursor
    AMPMC, King Abdullah University of Science and Technology, Saudi Arabia

    Steffen Richter
    Femtosecond Transient Spectroscopic Ellipsometry on Semiconductors
    ELI Beamlines, Fyzikální ústav AV ČR, v.v.i., Czechia

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